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當(dāng)前位置:首頁(yè)  >  技術(shù)文章  >  Agilent E5061A ENA-L 射頻網(wǎng)絡(luò)分析儀 深圳市美佳特

Agilent E5061A ENA-L 射頻網(wǎng)絡(luò)分析儀 深圳市美佳特

更新時(shí)間:2021-07-01      點(diǎn)擊次數(shù):974

Agilent E5061A ENA-L 射頻網(wǎng)絡(luò)分析儀,300 kHz 至 1.5 GHz

銷售,租賃,維修,回購(gòu)利用,技術(shù)方案技持等服務(wù)=深圳市美佳特科技有限公司

主要特性與技術(shù)指標(biāo)

描述

E5061A 通用網(wǎng)絡(luò)分析儀采用現(xiàn)代的技術(shù),具有易于使用的特性和穩(wěn)定的性能,從而能夠進(jìn)行可靠的基礎(chǔ) S 參數(shù)測(cè)量。

Table 1-10 Test port input levels

Description Specification Typical

Maximum test port input level

 300 kHz to 3 GHz +10 dBm

Damage level

 300 kHz to 3 GHz +20 dBm, ±30 VDC

Crosstalk1

 300 kHz to 3 GHz –110 dB

Table 1-11 Test port input (trace noise2)

Description Specification Typical

Trace noise magnitude

 300 kHz to 1 MHz 8 mdB rms (23 °C ±5 °C)

 (source power level = +10 dBm)

 1 MHz to 3 GHz 5 mdB rms (23 °C ±5 °C)

 (source power level = +10 dBm)

Trace noise phase

 300 kHz to 1 MHz 0.05° rms (23 °C ±5 °C)

 (source power level = +10 dBm)

 1 MHz to 3 GHz 0.03° rms (23 °C ±5 °C)

 (source power level = +10 dBm)

Test port input

1. Response calibration not omitted.

2. Trace noise is defined as a ratio measurement of a through, at IF bandwidth = 3 kHz.

3. Stability is defined as a ratio measurement at the test port.

Table 1-12 Test port input (stability 3)

Description Specification Typical

Stability magnitude

3 MHz to 3 GHz 0.01 dB/°C

 (at 23 °C ±5 °C)

Stability phase

3 MHz to 3 GHz 0.1°/°C

 (at 23 °C ±5 °C)